डेटा पत्रक ( Datasheet PDF ) |
भाग संख्या | विवरण | मैन्युफैक्चरर्स | |
SN74ABT18646 | SCAN TEST DEVICE D Member of the Texas Instruments
Widebus Family
D Compatible With IEEE Std 1149.1-1990
(JTAG) Test Access Port and
Boundary-Scan Architecture
D Includes D-Type Flip-Flops and Control
Circuitry to Provide Mu |
etcTI |
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SN74ABT18640 | SCAN TEST DEVICE | etcTI |
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SN74ABT18646 | SCAN TEST DEVICE | etcTI |
www.DataSheet.in | 2017 | संपर्क |